The ring wave test is expected to simulate voltage disturbances that can happen on account of operations, similar to those achieved by fast switching semiconductor devices.
The goal is to evaluate the device’s immunity to these ring wave transients, guaranteeing that it keeps on working without being adversely impacted by the sudden voltage changes.
The Ring Wave Test (IEC/BS EN 61000-4-12) is a standard that indicates test procedures and immunity levels.
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