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Slow Damped Oscillatory and Ring Wave Test

Slow Damped oscillatory wave and ring wave tests are evaluations performed in the field of electromagnetic compatibility (EMC) to assess the resilience of electronic devices against specific types of electrical transients.

Slow Damped Oscillatory Wave Test

  • This test simulates a type of voltage transient caused by the switching of inductive loads or switching operations in electrical systems.
  • The purpose is to evaluate how well the device can withstand these transient voltage impulses without malfunctioning, sustaining damage, or causing interference to other devices.
  • The damped oscillatory wave IEC/BS EN 61000-4-18 is a standard that specifies test procedures and immunity levels.

Slow Damped Ring Wave Test

  • The ring wave test is designed to simulate voltage disturbances that can occur due to switching operations, such as those caused by fast-switching semiconductor devices.
  • The objective is to assess the device’s immunity to these ring wave transients, ensuring that it continues to operate without being adversely affected by the sudden voltage changes.
  • The Ring Wave Test (IEC/BS EN 61000-4-12) is a standard that specifies test procedures and immunity levels.
Damped Oscillatory Wave
Open circuit test voltage
Level
Differential Mode in kVCommon Mode Voltage in kV
Line-to-LineLine-to-ground
10.250. 5
20.51
312a
4b––
x cspecialspecial
Ring Wave
Open circuit test voltage
Level
Differential Mode in kVCommon Mode (kV)
Line-to-LineLine-to-ground
10.250.5
20.51
312
424
x aspecialspecial
Slow Damped Oscillatory and Ring Wave Test
amped Oscillatory and Ring Wave Test

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