Damped oscillatory wave and ring wave:

Damped oscillatory wave and ring wave tests are evaluations performed in the field of electromagnetic compatibility (EMC) to assess the resilience of electronic devices against specific types of electrical transients.

Damped Oscillatory Wave Test:

• This test simulates a type of voltage transient caused by the switching of inductive loads or switching operations in electrical systems.
• The purpose is to evaluate how well the device can withstand these transient voltage impulses without malfunctioning, sustaining damage, or causing interference to other devices.
• The damped oscillatory wave IEC/BS EN 61000-4-18 is a standard that specifies test procedures and immunity levels.

Ring Wave Test:

• The ring wave test is designed to simulate voltage disturbances that can occur due to switching operations, such as those caused by fast-switching semiconductor devices.
• The objective is to assess the device’s immunity to these ring wave transients, ensuring that it continues to operate without being adversely affected by the sudden voltage changes.
• The Ring Wave Test (IEC/BS EN 61000-4-12) is a standard that specifies test procedures and immunity levels.
  
  

Both of these tests are crucial components of EMC testing, aiming to ensure that electronic devices comply with industry standards and regulations. Passing these tests confirms that devices can tolerate and function properly in environments where transient voltage events, like damped oscillatory waves or ring waves, might occur, thereby ensuring their reliability and performance in real-world scenarios.